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| Citation: | Yingjian Yan, Jijun Xu, Shoucheng Wang, Zhong Wang, Min Liu. Method Based on Time Randomization to Resist Fault Sensitivity Analysis[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2017, 26(3): 411-417.doi:10.15918/j.jbit1004-0579.201726.0318
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