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Article Navigation> JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY> 2018> 27(1): 65-73
Meijing Gao, Ailing Tan, Jie Xu, Weiqi Jin, Zhenlong Zu, Ming Yang. Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2018, 27(1): 65-73. doi: 10.15918/j.jbit1004-0579.201827.0109
Citation: Meijing Gao, Ailing Tan, Jie Xu, Weiqi Jin, Zhenlong Zu, Ming Yang. Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2018, 27(1): 65-73.doi:10.15918/j.jbit1004-0579.201827.0109
shu

Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System

doi:10.15918/j.jbit1004-0579.201827.0109
  • 1.

    The Key Laboratory for Special Fiber and Fiber Sensor of Hebei Province, School of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei 066004, China

  • 2.

    School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China

  • Received Date:2017-06-20
    Abstract
  • Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
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