Citation: | Yu Miao, Jiwei Huo, Ze Liu, Ying Gao, Chengfei Wang. Fast Rail Defect Inspection Based on Half-Cycle Power Demodulation Method and FPGA Implementation[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2022, 31(2): 185-195.doi:10.15918/j.jbit1004-0579.2021.053 |
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