Shao Bin, Zou Jian, Su Wenyong, Li Qianshu. Dynamic Behavior of Voltage Across Small Capacitance Josephson Junction[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1999, 8(4): 370-373.
Citation:
Shao Bin, Zou Jian, Su Wenyong, Li Qianshu. Dynamic Behavior of Voltage Across Small Capacitance Josephson Junction[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1999, 8(4): 370-373.
Shao Bin, Zou Jian, Su Wenyong, Li Qianshu. Dynamic Behavior of Voltage Across Small Capacitance Josephson Junction[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1999, 8(4): 370-373.
Citation:
Shao Bin, Zou Jian, Su Wenyong, Li Qianshu. Dynamic Behavior of Voltage Across Small Capacitance Josephson Junction[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1999, 8(4): 370-373.
Aim To study the dynamic behavior of voltage across small capacitance Josephson junction. Methods A model of the mesoscopic Josephson junction coupled with a single mode quantized radiation field was used. Results A Gaussian type envelope factor exhibiting quantum collapse and revival(CR) phenomenon was obtained. Conclusion It is shown that for the squeezed state the time evolution of the voltage can exhibit drastically quantum CR phenomenon.