Welcome to Journal of Beijing Institute of Technology
Advance Search
Volume 22Issue 2
.
Turn off MathJax
Article Contents
Article Navigation> JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY> 2013> 22(2): 250-255
GUAN Cong-rong, GAO Mei-jing, JIN Wei-qi, WANG Ji-hui. Optical micro-scanning location calibration of thermal microscope imaging system[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2013, 22(2): 250-255.
Citation: GUAN Cong-rong, GAO Mei-jing, JIN Wei-qi, WANG Ji-hui. Optical micro-scanning location calibration of thermal microscope imaging system[J].JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2013, 22(2): 250-255.
shu

Optical micro-scanning location calibration of thermal microscope imaging system

  • 1.

    MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China;College of Mechanical and Electrical Engineering, North China University of Technology, Beijing 100041, China

  • 2.

    Department of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei 066004, China

  • 3.

    MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China

  • Received Date:2012-03-16
    Abstract
  • A method of micro-scanning location adaptive calibration was proposed, which was realized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direction of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging quality.
    • FullText(HTML)
  • loading
    • References (10)
  • [1]
    Wiltsc J M, Miller J L. Imagery improvements in staring infrared imagers by employing subpixel microscan[J]. Optical Engineering, 2005, 44(5): 056401- 056409.
    [2]
    Lee S Y, Tung H W, Chen W C, et al. Thermal actuated solid tunable lens[J]. IEEE Photonics Technology Letters, 2006, 18(21): 2191- 2193.
    [3]
    Gao Meijing, Jin Weiqi, Wang Xia, et al. Design and implementation of optical micro-scanning thermal microscope imaging system with high resolution[J]. Chinese Journal of Scientific Instrument, 2009, 30(5): 1037-1041. (in Chinese)
    [4]
    Joachimsthaler I, Zimmermann G, Heiderhoff R. SEM/STEM-hybrid-system: a new tool for advanced thermal analysis of electronic devices [C]//Proceeding of 9th IPFA. Singapore: [s.n.], 2002: 196-200.
    [5]
    Zhang Yi, Bai Lianfa, Chen Qian,et al. Performance analysis and computation for spatial resolving capability of IRFPA micro-scan[J]. Infrared and Laser Engineering, 2009, 38(2): 221-225. (in Chinese)
    [6]
    Qu Huiming, Chen Qian. Comparison of microscanning schemes in infrared focal plane array imaging[J]. Laser & Infrared,2006,36(3):161-164. (in Chinese)
    [7]
    Gao Meijing, Jin Weiqi, Wang Xia, et al. Zero calibration for the designed microscanning thermal microscope imaging system[J]. Acta Opitca Sinica, 2009, 29(8): 2175-2179. (in Chinese)
    [8]
    Wang Lei, Shen Tingzhi. Two-dimensional entropy method based on genetic algorithm[J]. Journal of Beijing Institute of Technology, 2002, 11(2): 184-188.
    [9]
    Xydeas C S, Petrovic V. Objective image fusion performance measure[J]. Electronics Letters, 2000, 36(4): 308-310.
    [10]
    Petrovic V, Xydeas C S. Sensor noise effects on signal-level image fusion performance[J]. Information Fusion, 2003, 4(3): 167-183.
    • Relative Articles
  • Supplements (0)
  • Cited By
  • 加载中

Catalog

    通讯作者:陈斌, bchen63@163.com
    • 1.

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索
    Get Citation
    PDF
    XML

    Article Metrics

    Article views (1264) PDF downloads(868) Cited by()
    Proportional views
    Related

    Address:5 Zhongguancun South Street, Haidian District, Beijing

    Tel:86-10-68914374

    Email:blgywb@bit.edu.cn

    Copy Right © Journal of Beijing Institute of Technology

    Supported by:Beijing Renhe Information Technology Co. Ltd

    /

      Return
      Return
        Baidu
        map